Invention Grant
- Patent Title: Spectrometer, spectrometry, and spectrometry program
- Patent Title (中): 光谱仪,光谱测定和光谱测定程序
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Application No.: US13141152Application Date: 2009-09-08
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Publication No.: US08462337B2Publication Date: 2013-06-11
- Inventor: Motoyuki Watanabe , Kazuya Iguchi , Kengo Suzuki
- Applicant: Motoyuki Watanabe , Kazuya Iguchi , Kengo Suzuki
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: Hamamatsu Photonics K.K.
- Current Assignee: Hamamatsu Photonics K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2008-330349 20081225
- International Application: PCT/JP2009/065660 WO 20090908
- International Announcement: WO2010/073778 WO 20100701
- Main IPC: G01J1/04
- IPC: G01J1/04 ; G01J3/30

Abstract:
A spectroscopic measurement apparatus 1A comprises an integrating sphere 20 in which a sample S is located, a spectroscopic analyzer 30 dispersing the light to be measured from the sample S and obtaining a wavelength spectrum, and a data analyzer 50. The analyzer 50 includes an object range setting section which sets a first object range corresponding to excitation light and a second object range corresponding to light emission from the sample S in a wavelength spectrum, and a sample information analyzing section which determines a luminescence quantum yield of the sample S, determines a measurement value Φ0 of the luminescence quantum yield from results of a reference measurement and a sample measurement, and determines, by using factors β, γ regarding stray light in the reference measurement, an analysis value Φ of the luminescence quantum yield with the effect of stray light reduced by Φ=βΦ0+γ. This realizes a spectroscopic measurement apparatus, a measurement method, and a measurement program which can reduce the effect of stray light generated in a spectrometer.
Public/Granted literature
- US20110255085A1 SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM Public/Granted day:2011-10-20
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