发明授权
- 专利标题: Method for manufacturing semiconductor light emitting device
- 专利标题(中): 半导体发光元件的制造方法
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申请号: US13671580申请日: 2012-11-08
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公开(公告)号: US08470627B2公开(公告)日: 2013-06-25
- 发明人: Yasuo Ohba , Kei Kaneko , Toru Gotoda , Hiroshi Katsuno , Mitsuhiro Kushibe
- 申请人: Yasuo Ohba , Kei Kaneko , Toru Gotoda , Hiroshi Katsuno , Mitsuhiro Kushibe
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 优先权: JP2008-218028 20080827
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
A method for manufacturing a semiconductor light emitting device is provided. The device includes: an n-type semiconductor layer; a p-type semiconductor layer; and a light emitting unit provided between the n-type semiconductor layer and the p-type semiconductor layer. The method includes: forming a buffer layer made of a crystalline AlxGa1-xN (0.8≦x≦1) on a first substrate made of c-plane sapphire and forming a GaN layer on the buffer layer; stacking the n-type semiconductor layer, the light emitting unit, and the p-type semiconductor layer on the GaN layer; and separating the first substrate by irradiating the GaN layer with a laser having a wavelength shorter than a bandgap wavelength of GaN from the first substrate side through the first substrate and the buffer layer.
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