Invention Grant
US08472098B2 Manufacturing method for stress compensated X-Y gimbaled MEMS mirror array
有权
应力补偿X-Y万向MEMS反射镜阵列的制造方法
- Patent Title: Manufacturing method for stress compensated X-Y gimbaled MEMS mirror array
- Patent Title (中): 应力补偿X-Y万向MEMS反射镜阵列的制造方法
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Application No.: US12877053Application Date: 2010-09-07
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Publication No.: US08472098B2Publication Date: 2013-06-25
- Inventor: Chialun Tsai , Jeffrey F. DeNatale
- Applicant: Chialun Tsai , Jeffrey F. DeNatale
- Applicant Address: US CA Thousand Oaks
- Assignee: Teledyne Scientific & Imaging, LLC
- Current Assignee: Teledyne Scientific & Imaging, LLC
- Current Assignee Address: US CA Thousand Oaks
- Agency: Snell & Wilmer LLP
- Main IPC: G02B26/08
- IPC: G02B26/08

Abstract:
A wafer-level manufacturing method produces stress compensated x-y gimbaled comb-driven MEMS mirror arrays using two SOI wafers and a single carrier wafer. MEMS structures such as comb drives, springs, and optical surfaces are formed by processing front substrate layer surfaces of the SOI wafers, bonding together the processed surfaces, and removing the unprocessed SOI layers to expose second surfaces of the front substrate layers for further wafer-level processing. The bonded SOI wafers are mounted to a surface of the carrier wafer that has been separately processed. Processing wafer surfaces may include formation of a stress compensation layer to counteract physical effects of MEMS mirrors. The method may form multi-layered conductive spring structures for the mirrors, each spring having a first conducting layer for energizing a comb drive, a second conducting layer imparting a restoring force, and an insulating layer between the first and second conducting layers.
Public/Granted literature
- US20110228370A1 MANUFACTURING METHOD FOR STRESS COMPENSATED X-Y GIMBALED MEMS MIRROR ARRAY Public/Granted day:2011-09-22
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