Invention Grant
- Patent Title: Measuring system
- Patent Title (中): 测量系统
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Application No.: US13098149Application Date: 2011-04-29
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Publication No.: US08479403B2Publication Date: 2013-07-09
- Inventor: Pascal Jordil , Benjamin Vullioud
- Applicant: Pascal Jordil , Benjamin Vullioud
- Applicant Address: CH Renens
- Assignee: Tesa SA
- Current Assignee: Tesa SA
- Current Assignee Address: CH Renens
- Agency: Maschoff Brennan
- Priority: EP10161754 20100503
- Main IPC: G01B5/008
- IPC: G01B5/008

Abstract:
Measuring system including a coordinate measuring machine having a processing unit and a moveable support, and one or more actuators for positioning said movable support relative to a reference surface, the moveable support having a support connector, a scanning probe, detachably connected with the moveable support, for measuring points lying on a scanning path on a surface of a workpiece positioned on the reference surface, a modular rotation fitting, comprising a first connector, arranged to interoperate with the support connector for connecting the modular rotation fitting to said moveable support, and a second connector, arranged to interoperate with the probe connector, for connecting the scanning probe to the modular rotation fitting, and an actuator, for rotating the second connector relative to said first connector, wherein the first and said second connector contain a plurality of signal connections for transmitting driving signals to the actuator of said modular rotation fitting.
Public/Granted literature
- US20110270570A1 MEASURING SYSTEM Public/Granted day:2011-11-03
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