Invention Grant
- Patent Title: Electromagnetic wave measuring apparatus, measuring method, program, and recording medium
- Patent Title (中): 电磁波测量装置,测量方法,程序和记录介质
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Application No.: US12731617Application Date: 2010-03-25
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Publication No.: US08481938B2Publication Date: 2013-07-09
- Inventor: Shigeki Nishina , Motoki Imamura , Akiyoshi Irisawa , Tomoyu Yamashita , Eiji Kato
- Applicant: Shigeki Nishina , Motoki Imamura , Akiyoshi Irisawa , Tomoyu Yamashita , Eiji Kato
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2009-157146 20090701
- Main IPC: G01J3/00
- IPC: G01J3/00 ; G01J9/00

Abstract:
According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test and a container storing at least a part of the device under test.
Public/Granted literature
- US20110001048A1 ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM Public/Granted day:2011-01-06
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