Invention Grant
- Patent Title: Radiance measuring device
- Patent Title (中): 辐射测量装置
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Application No.: US13002924Application Date: 2009-07-06
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Publication No.: US08482726B2Publication Date: 2013-07-09
- Inventor: TongSheng Mou
- Applicant: TongSheng Mou
- Applicant Address: CN Westlake District, Hangzhou, Zhejiang
- Assignee: Hangzhou Zhejiang University Sensing Instruments Co., Ltd.
- Current Assignee: Hangzhou Zhejiang University Sensing Instruments Co., Ltd.
- Current Assignee Address: CN Westlake District, Hangzhou, Zhejiang
- Agency: Global IP Services
- Agent Tianhua Gu
- Priority: CN200810062957 20080707
- International Application: PCT/CN2009/072653 WO 20090706
- International Announcement: WO2010/003362 WO 20100114
- Main IPC: G01J1/40
- IPC: G01J1/40

Abstract:
A radiance measuring device comprises an imaging device, a light measuring device (2) and a connection seat (3) for connecting the imaging device with the light measuring device (2). The emission port of the imaging device corresponds to the incidence port of the light measuring device (2). The imaging device comprises an imaging lens (1-1) and an aperture diaphragm (1-2), and the aperture diaphragm (1-2) is located on the front focal plane of the imaging lens (1-1).
Public/Granted literature
- US20110116083A1 Radiance Measuring Device Public/Granted day:2011-05-19
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