Invention Grant
- Patent Title: Method and system for scatter correction in X-ray imaging
- Patent Title (中): X射线成像中散射校正的方法和系统
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Application No.: US13174480Application Date: 2011-06-30
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Publication No.: US08483471B2Publication Date: 2013-07-09
- Inventor: Xiaoye Wu , Jiang Hsieh , Paavana Sainath , Xin Liu
- Applicant: Xiaoye Wu , Jiang Hsieh , Paavana Sainath , Xin Liu
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Marie-Claire B. Maple
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Approaches for deriving scatter information using inverse tracking of scattered X-rays is disclosed. In certain embodiments scattered rays are tracked from respective locations on a detector to a source of the X-ray radiation, as opposed to tracking schemes that proceed from the source to the detector. In one such approach, the inverse tracking is implemented using a density integrated volume that reduces the integration steps performed.
Public/Granted literature
- US20130004050A1 METHOD AND SYSTEM FOR SCATTER CORRECTION IN X-RAY IMAGING Public/Granted day:2013-01-03
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