Invention Grant
- Patent Title: Detection values correction apparatus
- Patent Title (中): 检测值校正装置
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Application No.: US12692786Application Date: 2010-01-25
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Publication No.: US08488902B2Publication Date: 2013-07-16
- Inventor: Matthias Bertram
- Applicant: Matthias Bertram
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP09151598 20090129
- Main IPC: G06K9/40
- IPC: G06K9/40

Abstract:
The present invention relates to a detection values correction apparatus for correcting detection values of a projection image of a multi-energy imaging system. A scatter contribution providing unit provides scatter contributions for different intensities, different energies and different locations on the detection surface of the detection values. A scatter contributions combining unit combines scatter contributions for correcting a detection value, wherein the combined scatter contributions represent the contribution of the scatter, which is caused by radiation of the other detection values of the projection image, to the detection value to be corrected and wherein the scatter contributions are combined under consideration of the intensity, energy and location on the detection surface of the other detection values. A correction unit scatter corrects the detection value of the projection image by using the combined scatter contributions.
Public/Granted literature
- US20100189376A1 DETECTION VALUES CORRECTION APPARATUS Public/Granted day:2010-07-29
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