Invention Grant
- Patent Title: Device for testing an electrical component
- Patent Title (中): 用于测试电气部件的装置
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Application No.: US12900989Application Date: 2010-10-08
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Publication No.: US08494803B2Publication Date: 2013-07-23
- Inventor: Dirk Hasse , Peter Scheibelhut , Dirk Bittner , Robert Polnau
- Applicant: Dirk Hasse , Peter Scheibelhut , Dirk Bittner , Robert Polnau
- Applicant Address: DE Paderborn
- Assignee: DSpace Digital Signal Processing and Control Engineering GmbH
- Current Assignee: DSpace Digital Signal Processing and Control Engineering GmbH
- Current Assignee Address: DE Paderborn
- Agency: Muncy, Geissler, Olds & Lowe, PLLC
- Priority: DE102009048981 20091009
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/02 ; G06F17/50
Abstract:
A device for testing an electrical component is provided, having a simulation device for generating a simulation signal, a testing device for connecting the electrical component, at least two connecting devices, and a selection device for selecting the connecting device, wherein the simulation device and the testing device can be connected in an electrically conducting manner to at least one of the connecting devices by the selection device and the individual connecting devices differ from one another in at least one electrical property. Thus, a device for testing an electrical component is provided with which in a simple manner the testing accuracy can be increased by minimizing the signal corruption due to a parasitic property of the connecting device.
Public/Granted literature
- US20110087477A1 DEVICE FOR TESTING AN ELECTRICAL COMPONENT Public/Granted day:2011-04-14
Information query
