Invention Grant
US08495283B2 Nonvolatile memory device, memory system comprising nonvolatile memory device, and wear leveling method for nonvolatile memory device 有权
非易失性存储器件,包括非易失性存储器件的存储器系统和用于非易失性存储器件的磨损均衡方法

  • Patent Title: Nonvolatile memory device, memory system comprising nonvolatile memory device, and wear leveling method for nonvolatile memory device
  • Patent Title (中): 非易失性存储器件,包括非易失性存储器件的存储器系统和用于非易失性存储器件的磨损均衡方法
  • Application No.: US12947003
    Application Date: 2010-11-16
  • Publication No.: US08495283B2
    Publication Date: 2013-07-23
  • Inventor: Min Gun ParkKi Tae Park
  • Applicant: Min Gun ParkKi Tae Park
  • Applicant Address: KR Suwon-si, Gyeonggi-do
  • Assignee: Samsung Electronics Co., Ltd.
  • Current Assignee: Samsung Electronics Co., Ltd.
  • Current Assignee Address: KR Suwon-si, Gyeonggi-do
  • Agency: Volentine & Whitt, PLLC
  • Priority: KR10-2009-0116010 20091127
  • Main IPC: G06F12/00
  • IPC: G06F12/00
Nonvolatile memory device, memory system comprising nonvolatile memory device, and wear leveling method for nonvolatile memory device
Abstract:
A nonvolatile memory device comprises a memory core and a controller for controlling the wear level of a memory block in the nonvolatile memory device. The controller determines the wear level of a memory block by obtaining data of an actual wear level from a charge measurement cell of a selected region of the memory cell, and stores the wear level of the selected region in an erase count table.
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