Invention Grant
US08495537B1 Timing analysis of an array circuit cross section 失效
阵列电路截面的时序分析

Timing analysis of an array circuit cross section
Abstract:
A method, system or computer usable program product for performing timing analysis on an array circuit including receiving in memory a set of pins to be timed, selecting with a data processor a cross section of the array circuit including the set of pins wherein a backtrace is performed from the set of pins to identify a set of bus groups, each bus group having a plurality of timing pins, and assigning timing for an assigned pin of a first bus group equal to timing calculated for a surrogate pin of the first bus group based on array circuit regularity.
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