Invention Grant
- Patent Title: Timing analysis of an array circuit cross section
- Patent Title (中): 阵列电路截面的时序分析
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Application No.: US13349325Application Date: 2012-01-12
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Publication No.: US08495537B1Publication Date: 2013-07-23
- Inventor: Shyamkumar Thoziyoor , Tae H. Kim , Sang Y. Lee
- Applicant: Shyamkumar Thoziyoor , Tae H. Kim , Sang Y. Lee
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Paul S. Drake
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method, system or computer usable program product for performing timing analysis on an array circuit including receiving in memory a set of pins to be timed, selecting with a data processor a cross section of the array circuit including the set of pins wherein a backtrace is performed from the set of pins to identify a set of bus groups, each bus group having a plurality of timing pins, and assigning timing for an assigned pin of a first bus group equal to timing calculated for a surrogate pin of the first bus group based on array circuit regularity.
Public/Granted literature
- US20130185685A1 TIMING ANALYSIS OF AN ARRAY CIRCUIT CROSS SECTION Public/Granted day:2013-07-18
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