Invention Grant
- Patent Title: Self-aligned contact for trench MOSFET
- Patent Title (中): 沟槽MOSFET的自对准触点
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Application No.: US12792025Application Date: 2010-06-02
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Publication No.: US08497551B2Publication Date: 2013-07-30
- Inventor: Alex Kalnitsky , Hsiao-Chin Tuan , Kuo-Ming Wu , Wei Tsung Huang
- Applicant: Alex Kalnitsky , Hsiao-Chin Tuan , Kuo-Ming Wu , Wei Tsung Huang
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman Ham & Berner, LLP
- Main IPC: H01L29/66
- IPC: H01L29/66

Abstract:
The process methods and structures mentioned above for creating a trench MOSFET enables self-aligned contacts to be formed to allow decreasing pitch size for trench MOSFET. The self-aligned contacts are formed by etching exposed silicon areas without using lithographical mask and alignment. As a result, the allowance for alignment can be saved and the pitch size can be decreased.
Public/Granted literature
- US20110298045A1 SELF-ALIGNED CONTACT FOR TRENCH MOSFET Public/Granted day:2011-12-08
Information query
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