发明授权
US08498151B1 Data storage in analog memory cells using modified pass voltages
有权
使用修正的通过电压在模拟存储单元中数据存储
- 专利标题: Data storage in analog memory cells using modified pass voltages
- 专利标题(中): 使用修正的通过电压在模拟存储单元中数据存储
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申请号: US12534893申请日: 2009-08-04
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公开(公告)号: US08498151B1公开(公告)日: 2013-07-30
- 发明人: Shai Winter , Ofir Shalvi
- 申请人: Shai Winter , Ofir Shalvi
- 申请人地址: US CA Cupertino
- 专利权人: Apple Inc.
- 当前专利权人: Apple Inc.
- 当前专利权人地址: US CA Cupertino
- 代理机构: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- 主分类号: G11C11/34
- IPC分类号: G11C11/34 ; G11C16/06
摘要:
A method for data storage includes storing data in a target analog memory cell, which is one of a group of analog memory cells that are connected in series with one another, by writing a storage value into the target memory cell. The storage value written into the target memory cell is verified while biasing the other memory cells in the group with respective first pass voltages. After writing and verifying the storage value, the storage value is read from the target memory cell while biasing the other memory cells in the group with respective second pass voltages, wherein at least one of the second pass voltages applied to one of the other memory cells in the group is lower than a respective first pass voltage applied to the one of the other memory cells. The data is reconstructed responsively to the read storage value.
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