Invention Grant
- Patent Title: Image inspection apparatus
- Patent Title (中): 图像检测仪
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Application No.: US12920724Application Date: 2009-04-16
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Publication No.: US08498489B2Publication Date: 2013-07-30
- Inventor: Yuichi Abe , Mitsuji Ikeda , Yoshimichi Sato , Yasutaka Toyoda
- Applicant: Yuichi Abe , Mitsuji Ikeda , Yoshimichi Sato , Yasutaka Toyoda
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2008-106847 20080416
- International Application: PCT/JP2009/057662 WO 20090416
- International Announcement: WO2009/128505 WO 20091022
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06K9/00

Abstract:
The present invention provides a unified template matching technique which allows an adequate matching position to be provided even in an image with a distorted pattern shape and a variation in edge intensity. A correlation value contribution rate map is created for the vicinity of each of top candidate positions obtained by applying a centroid distance filter to a normalized correlation map resulting from template matching. A corrected intensity image is created from the correlation value contribution rate maps. Luminance correction is performed based on the corrected intensity image. Local matching is performed again on the vicinity of each candidate position. The candidates are then re-sorted based on candidate positions and correlation values newly obtained. Thus, even in an image with a distorted pattern shape and a variation in edge intensity, an adequate matching position can be provided in a unified manner.
Public/Granted literature
- US20110110597A1 IMAGE INSPECTION APPARATUS Public/Granted day:2011-05-12
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