Invention Grant
- Patent Title: Strained fully depleted silicon on insulator semiconductor device
- Patent Title (中): 应变完全耗尽的绝缘体上硅绝缘体器件
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Application No.: US11926655Application Date: 2007-10-29
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Publication No.: US08502283B2Publication Date: 2013-08-06
- Inventor: Qi Xiang , Niraj Subba , Witold P. Maszara , Zoran Krivokapic , Ming-Ren Lin
- Applicant: Qi Xiang , Niraj Subba , Witold P. Maszara , Zoran Krivokapic , Ming-Ren Lin
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Farjami & Farjami LLP
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
A semiconductor substrate is provided having an insulator thereon with a semiconductor layer on the insulator. A deep trench isolation is formed, introducing strain to the semiconductor layer. A gate dielectric and a gate are formed on the semiconductor layer. A spacer is formed around the gate, and the semiconductor layer and the insulator are removed outside the spacer. Recessed source/drain are formed outside the spacer.
Public/Granted literature
- US20080054316A1 STRAINED FULLY DEPLETED SILICON ON INSULATOR SEMICONDUCTOR DEVICE Public/Granted day:2008-03-06
Information query
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