• 专利标题: Gauge line position measuring device, program for measuring a gauge line position, and gauge line mark
  • 申请号: US12379393
    申请日: 2009-02-20
  • 公开(公告)号: US08502871B2
    公开(公告)日: 2013-08-06
  • 发明人: Hiroshi Tsuji
  • 申请人: Hiroshi Tsuji
  • 申请人地址: JP Kyoto-Shi
  • 专利权人: Shimadzu Corporation
  • 当前专利权人: Shimadzu Corporation
  • 当前专利权人地址: JP Kyoto-Shi
  • 代理商 Manabu Kanesaka
  • 优先权: JP2008-059462 20080310
  • 主分类号: H04N7/18
  • IPC分类号: H04N7/18
Gauge line position measuring device, program for measuring a gauge line position, and gauge line mark
摘要:
A gauge line position measuring device measures a position of a gauge line provided on a test piece by a non-contact video method. The measuring device includes a gauge line mark adapted to be provided on the test piece and has the gauge line and a first continuous harmonious color density arranged line-symmetrically with respect to the gauge line, and a video camera for taking an image of the gauge line mark on the test piece and outputting gauge line mark image data. A calculation device calculates a gauge line position based on the gauge line mark image data.
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