发明授权
- 专利标题： Semiconductor memory device, method of testing the same and system of testing the same
- 专利标题（中）： 半导体存储器件，测试方法与测试系统相同
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申请号： US13104262申请日： 2011-05-10
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公开(公告)号： US08503260B2公开(公告)日： 2013-08-06
- 发明人: Jeong-Tae Hwang , Jeong-Hun Lee
- 申请人： Jeong-Tae Hwang , Jeong-Hun Lee
- 申请人地址： KR Gyeonggi-do
- 专利权人： Hynix Semiconductor Inc.
- 当前专利权人： Hynix Semiconductor Inc.
- 当前专利权人地址： KR Gyeonggi-do
- 代理机构： IP & T Group LLP
- 优先权： KR10-2010-0129689 20101217
- 主分类号： G11C29/00
- IPC分类号： G11C29/00 ; G11C8/00
摘要：
A method of testing a semiconductor memory device comprises receiving a clock, addresses, commands, and data from a test device through channels, generating an internal bank address in response to the addresses and the commands, performing a multi-bit parallel test for each of a plurality of banks based on the addresses, the commands, the data, and the internal bank address, and providing the test device with a test result signal.
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