发明授权
- 专利标题： Phase-compensated anti-reflective thin flim coating
- 专利标题（中）： 相位补偿抗反射薄膜涂层
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申请号： US13588504申请日： 2012-08-17
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公开(公告)号： US08508676B2公开(公告)日： 2013-08-13
- 发明人: Barry D. Silverstein , Andrew F. Kurtz , Jennifer D. Kruschwitz
- 申请人： Barry D. Silverstein , Andrew F. Kurtz , Jennifer D. Kruschwitz
- 申请人地址： US NY Rochester
- 专利权人： Eastman Kodak Company
- 当前专利权人： Eastman Kodak Company
- 当前专利权人地址： US NY Rochester
- 代理商 Kevin E. Spaulding
- 主分类号： G02F1/1335
- IPC分类号： G02F1/1335 ; G02F1/13363
摘要：
An anti-reflective thin film coating formed on an optical surface, comprising a multilayer thin-film stack arranged to suppress reflection of incident polarized light within an incident light wavelength range. The multilayer thin-film stack further provides a reflectance edge transition at a wavelength band that lies outside the incident light wavelength range. The reflectance edge transition is arranged to provide phase difference compensation to the polarized light within the incident polarized light wavelength range.
公开/授权文献
- US20120307362A1 PHASE-COMPENSATED ANTI-REFLECTIVE THIN FLIM COATING 公开/授权日：2012-12-06
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