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US08509023B2 Method and system for split threshold voltage programmable bitcells 失效
分离阈值电压可编程位单元的方法和系统

Method and system for split threshold voltage programmable bitcells
Abstract:
A memory device includes an antifuse. The antifuse is configured to program a bit cell of the memory device. The antifuse is configured with a PMOS device.
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