发明授权
- 专利标题: Method of manufacturing layered chip package
- 专利标题(中): 分层芯片封装的制造方法
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申请号: US13064880申请日: 2011-04-22
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公开(公告)号: US08513034B2公开(公告)日: 2013-08-20
- 发明人: Yoshitaka Sasaki , Hiroyuki Ito , Tatsuya Harada , Nobuyuki Okuzawa , Satoru Sueki , Hiroshi Ikejima
- 申请人: Yoshitaka Sasaki , Hiroyuki Ito , Tatsuya Harada , Nobuyuki Okuzawa , Satoru Sueki , Hiroshi Ikejima
- 申请人地址: US CA Milpitas JP Tokyo CN Hong Kong
- 专利权人: Headway Technologies, Inc.,TDK Corporation,SAE Magnetics (H.K.) Ltd.
- 当前专利权人: Headway Technologies, Inc.,TDK Corporation,SAE Magnetics (H.K.) Ltd.
- 当前专利权人地址: US CA Milpitas JP Tokyo CN Hong Kong
- 代理机构: Oliff & Berridge, PLC
- 主分类号: H01L21/66
- IPC分类号: H01L21/66
摘要:
A method of manufacturing a layered chip package that includes a main body, and wiring disposed on a side surface of the main body. The main body includes a plurality of layer portions. The method includes fabricating a plurality of substructures, and completing the layered chip package by fabricating the main body using the plurality of substructures and by forming the wiring on the main body. Each substructure is fabricated through the steps of: fabricating a pre-substructure wafer including a plurality of pre-semiconductor-chip portions aligned; distinguishing between a normally functioning pre-semiconductor-chip portion and a malfunctioning pre-semiconductor-chip portion among the plurality of pre-semiconductor-chip portions included in the pre-substructure wafer; and forming electrodes connected to the normally functioning pre-semiconductor-chip portion and having respective end faces located in the side surface of the main body on which the wiring is disposed, without forming any electrode connected to the malfunctioning pre-semiconductor-chip portion.
公开/授权文献
- US20110201137A1 Method of manufacturing layered chip package 公开/授权日:2011-08-18
信息查询
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