发明授权
US08513624B2 Systems and methods of detecting force and stress using tetrapod nanocrystal
有权
使用四极纳米晶体检测力和应力的系统和方法
- 专利标题： Systems and methods of detecting force and stress using tetrapod nanocrystal
- 专利标题（中）： 使用四极纳米晶体检测力和应力的系统和方法
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申请号： US13357845申请日： 2012-01-25
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公开(公告)号： US08513624B2公开(公告)日： 2013-08-20
- 发明人: Charina L. Choi , Kristie J. Koski , Sanjeevi Sivasankar , A. Paul Alivisatos
- 申请人： Charina L. Choi , Kristie J. Koski , Sanjeevi Sivasankar , A. Paul Alivisatos
- 申请人地址： US CA Oakland
- 专利权人： The Regents of the University of California
- 当前专利权人： The Regents of the University of California
- 当前专利权人地址： US CA Oakland
- 代理机构： Lawrence Berkeley National Laboratory
- 主分类号： G01N21/64
- IPC分类号： G01N21/64
摘要：
Systems and methods of detecting force on the nanoscale including methods for detecting force using a tetrapod nanocrystal by exposing the tetrapod nanocrystal to light, which produces a luminescent response by the tetrapod nanocrystal. The method continues with detecting a difference in the luminescent response by the tetrapod nanocrystal relative to a base luminescent response that indicates a force between a first and second medium or stresses or strains experienced within a material. Such systems and methods find use with biological systems to measure forces in biological events or interactions.
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