发明授权
- 专利标题: X-ray dark-field imaging system and method
- 专利标题(中): X射线暗场成像系统及方法
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申请号: US13147952申请日: 2010-07-06
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公开(公告)号: US08515002B2公开(公告)日: 2013-08-20
- 发明人: Zhifeng Huang , Zhiqiang Chen , Li Zhang , Zhentian Wang , Yuxiang Xing , Ziran Zhao , Yongshun Xiao
- 申请人: Zhifeng Huang , Zhiqiang Chen , Li Zhang , Zhentian Wang , Yuxiang Xing , Ziran Zhao , Yongshun Xiao
- 申请人地址: CN Beijing CN Beijing
- 专利权人: Tsinghua University,Nuctech Company Limited
- 当前专利权人: Tsinghua University,Nuctech Company Limited
- 当前专利权人地址: CN Beijing CN Beijing
- 代理机构: Brinks Hofer Gilson & Lione
- 优先权: CN200910088662 20090707
- 国际申请: PCT/CN2010/001010 WO 20100706
- 国际公布: WO2011/003278 WO 20110113
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
An x-ray imaging technology, performing an x-ray dark-field CT imaging of an examined object using an imaging system which comprises an x-ray source, two absorbing gratings G1 and G2, an x-ray detector, a controller and a data processing unit, comprising the steps of: emitting x-rays to the examined object; enabling one of the two absorbing gratings G1 and G2 to perform phase stepping motion within at least one period range thereof; where in each phase stepping step, the detector receives the x-ray and converts it into an electric signal; wherein through the phase stepping of at least one period, the x-ray intensity at each pixel point on the detector is represented as an intensity curve; calculating a second moment of scattering angle distribution for each pixel, based on a contrast of the intensity curve at each pixel point on the detector and an intensity curve without presence of the examined object; taking images of the object at various angles, then obtaining an image with scattering information of the object in accordance with a CT reconstruction algorithm.
公开/授权文献
- US20110293064A1 X-RAY DARK-FIELD IMAGING SYSTEM AND METHOD 公开/授权日:2011-12-01