发明授权
- 专利标题： Drop test apparatus
- 专利标题（中）： 跌落试验装置
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申请号： US12964265申请日： 2010-12-09
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公开(公告)号： US08516877B2公开(公告)日： 2013-08-27
- 发明人: Yin Le , Yu-Lin Liu , Qiang Zhang
- 申请人： Yin Le , Yu-Lin Liu , Qiang Zhang
- 申请人地址： CN Shenzhen TW New Taipei
- 专利权人： Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人： Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址： CN Shenzhen TW New Taipei
- 代理机构： Altis Law Group, Inc.
- 优先权： CN201010234747 20100723
- 主分类号： G01N3/00
- IPC分类号： G01N3/00 ; G01N19/02
摘要：
A drop test apparatus includes a base panel, at least one height adjustment member attached to the base panel, and at least one angle adjustment member pivotally attached to the at least one height adjustment member. The at least one height adjustment member has a portion protruding upward from the base panel. A height of the portion is variable. The at least one angle adjustment member is configured for supporting a device thereon and capable of rotating to different angles.
公开/授权文献
- US20120017664A1 DROP TEST APPARATUS 公开/授权日：2012-01-26
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