An electrostatic discharge protection device is disclosed. The electrostatic discharge protection device preferably includes a first transistor, a second transistor, and an electrostatic discharge clamping circuit. The first transistor includes a first drain electrically connected to an input/output pin of a chip, a first source electrically connected to a first voltage input pin of the chip, and a first gate. The first drain is preferably an internally shrunk drain. The second transistor includes a second drain electrically connected to the input/output pin of the chip, a second source electrically connected to a second voltage input pin and a second gate. The electrostatic discharge clamping circuit is electrically connected to the first voltage input pin and the second voltage input pin.