Invention Grant
US08520461B2 Row address code selection based on locations of substandard memory cells
有权
基于不合格存储单元位置的行地址码选择
- Patent Title: Row address code selection based on locations of substandard memory cells
- Patent Title (中): 基于不合格存储单元位置的行地址码选择
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Application No.: US12832208Application Date: 2010-07-08
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Publication No.: US08520461B2Publication Date: 2013-08-27
- Inventor: Dong-Hyuk Lee , Jung-Bae Lee , Ki-Won Park
- Applicant: Dong-Hyuk Lee , Jung-Bae Lee , Ki-Won Park
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2009-0088368 20090918
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A memory device identifies memory blocks that contain substandard memory cells. The memory device then determines row address codes to apply to the memory blocks during refresh operations. The row address codes determine which memory blocks of the memory block are refreshed together. The row address codes are designed to ensure that memory blocks having substandard memory cells, which must be refreshed more frequently than other cells, are refreshed together, while memory blocks without substandard memory cells are refreshed together.
Public/Granted literature
- US20110069572A1 ROW ADDRESS CODE SELECTION BASED ON LOCATIONS OF SUBSTANDARD MEMORY CELLS Public/Granted day:2011-03-24
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