发明授权
- 专利标题： Analysis method, radiation imaging apparatus using analysis method, and analysis program for executing analysis method
- 专利标题（中）： 分析方法，辐射成像仪使用分析方法，分析程序执行分析方法
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申请号： US13060112申请日： 2009-10-28
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公开(公告)号： US08520799B2公开(公告)日： 2013-08-27
- 发明人: Kentaro Nagai , Toru Den
- 申请人： Kentaro Nagai , Toru Den
- 申请人地址： JP Tokyo
- 专利权人： Canon Kabushiki Kaisha
- 当前专利权人： Canon Kabushiki Kaisha
- 当前专利权人地址： JP Tokyo
- 代理机构： Fitzpatrick, Cella, Harper & Scinto
- 优先权： JP2008-278425 20081029
- 国际申请： PCT/JP2009/068863 WO 20091028
- 国际公布： WO2010/050611 WO 20100506
- 主分类号： G03H5/00
- IPC分类号： G03H5/00
摘要：
An analysis method for use in a radiation imaging apparatus employing intensity information of interference fringes of radiation rays that have passed through a detected object includes the steps of generating first phase information of the detected object wrapped into a range of 2π from the intensity information of the interference fringes; generating information on an absorption intensity gradient of the detected object from the intensity information of the interference fringes; generating a weighting function on the basis of an absolute value of a gradient in the information on the absorption intensity gradient; and generating second phase information by unwrapping the first phase information by using the weighting function.
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