发明授权
- 专利标题: Family of multiplexer/flip-flops with enhanced testability
- 专利标题(中): 具有增强可测性的多路复用器/触发器系列
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申请号: US12796949申请日: 2010-06-09
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公开(公告)号: US08525565B2公开(公告)日: 2013-09-03
- 发明人: Mujibur Rahman , Timothy D. Anderson , Alan Hales
- 申请人: Mujibur Rahman , Timothy D. Anderson , Alan Hales
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 Robert D. Marshall, Jr.; Wade James Brady, III; Frederick J. Telecky, Jr.
- 主分类号: H03K3/289
- IPC分类号: H03K3/289 ; H03K3/356
摘要:
A multibit combined multiplexer and flip-flop circuit has a plurality of bit circuits. Each bit circuit includes and input section, a flip-flop section and a per bit control section. The input sections have inputs for plural of input signals and corresponding input pass gates. The outputs of the input pass gates are connected to the input of the flip-flop section. Each per bit control section includes an inverter for each input terminal. There is a combined control section receiving a clock signal and a control signals for selection of only one of the input signals. The combined control section include a logical AND for each input signal combining the clock signal and the selection signal. The output of each logical AND is connected to the input of a corresponding inverter of each per bit control circuit. The input pass gate are controlled by a corresponding logical AND and said corresponding inverter.
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