发明授权
- 专利标题: Pattern identification method, parameter learning method and apparatus
- 专利标题(中): 模式识别方法,参数学习方法和装置
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申请号: US12205174申请日: 2008-09-05
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公开(公告)号: US08527439B2公开(公告)日: 2013-09-03
- 发明人: Kan Torii , Katsuhiko Mori , Yusuke Mitarai , Hiroshi Sato , Yuji Kaneda , Takashi Suzuki
- 申请人: Kan Torii , Katsuhiko Mori , Yusuke Mitarai , Hiroshi Sato , Yuji Kaneda , Takashi Suzuki
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: JP2007-252375 20070927
- 主分类号: G06F17/00
- IPC分类号: G06F17/00
摘要:
In a pattern identification method in which input data is classified into predetermined classes by sequentially executing a combination of a plurality of classification processes, at least one of the classification processes includes a mapping step of mapping the input data in an N (N≧2) dimensional feature space as corresponding points, a determination step of determining whether or not to execute the next classification process based on the corresponding points, and selecting step of selecting a classification process to be executed next based on the corresponding points when it is determined in the determination step that the next classification process should be executed.
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