发明授权
- 专利标题: Method for fabricating a semiconductor device
- 专利标题(中): 半导体器件的制造方法
-
申请号: US13736453申请日: 2013-01-08
-
公开(公告)号: US08530316B2公开(公告)日: 2013-09-10
- 发明人: Yu-Hung Cheng , Jhi-Cherng Lu , Ming-Hua Yu , Chii-Horng Li , Tze-Liang Lee
- 申请人: Yu-Hung Cheng , Jhi-Cherng Lu , Ming-Hua Yu , Chii-Horng Li , Tze-Liang Lee
- 申请人地址: TW
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW
- 代理机构: Lowe Hauptman & Ham, LLP
- 主分类号: H01L21/336
- IPC分类号: H01L21/336
摘要:
A method for fabricating a semiconductor device, the method including growing a first semiconductor structure comprising a first semiconductor material on a surface of a substrate, wherein growing the first semiconductor structure includes forming a semiconductor particle comprising the first semiconductor material on a second semiconductor structure of the semiconductor device. The method further includes forming a protection layer of a second semiconductor material on the first semiconductor structure, wherein forming the protection layer includes forming the protection layer on the semiconductor particle. The method further includes removing a portion of the protection layer, wherein removing the portion of the protection layer includes fully removing the protection layer on the semiconductor particle and the semiconductor particle.
公开/授权文献
- US20130122675A1 METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE 公开/授权日:2013-05-16
信息查询
IPC分类: