发明授权
- 专利标题: Method for direct deposition of a germanium layer
- 专利标题(中): 直接沉积锗层的方法
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申请号: US13347834申请日: 2012-01-11
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公开(公告)号: US08530339B2公开(公告)日: 2013-09-10
- 发明人: Benjamin Vincent , Matty Caymax , Roger Loo , Johan Dekoster
- 申请人: Benjamin Vincent , Matty Caymax , Roger Loo , Johan Dekoster
- 申请人地址: BE Leuven
- 专利权人: IMEC
- 当前专利权人: IMEC
- 当前专利权人地址: BE Leuven
- 代理机构: McDonnell Boehnen Hulbert & Berghoff LLP
- 优先权: EP11150559 20110111
- 主分类号: H01L29/16
- IPC分类号: H01L29/16
摘要:
The present disclosure is related to a method for the deposition of a continuous layer of germanium on a substrate by chemical vapor deposition. According to the disclosure, a mixture of a non-reactive carrier gas and a higher order germanium precursor gas, i.e. of higher order than germane (GeH4), is applied. In an example embodiment, the deposition is done under application of a deposition temperature between 275° C. and 500° C., with the partial pressure of the precursor gas within the mixture being at least 20 mTorr for temperatures between 275° C. and 285° C., and at least 10 mTorr for temperatures between 285° and 500° C.
公开/授权文献
- US20120175741A1 Method for Direct Deposition of a Germanium Layer 公开/授权日:2012-07-12
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