Invention Grant
- Patent Title: Charged particle source from a photoionized cold atom beam
- Patent Title (中): 来自光电离冷原子束的带电粒子源
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Application No.: US13369008Application Date: 2012-02-08
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Publication No.: US08530853B2Publication Date: 2013-09-10
- Inventor: Adam V. Steele , Brenton J. Knuffman , Jabez J. McClelland
- Applicant: Adam V. Steele , Brenton J. Knuffman , Jabez J. McClelland
- Applicant Address: US DC Washington
- Assignee: The United States of America, as represented by the Secretary of Commerce, NIST
- Current Assignee: The United States of America, as represented by the Secretary of Commerce, NIST
- Current Assignee Address: US DC Washington
- Agency: Burton IP Law Group
- Agent Daphne Burton
- Main IPC: H01J27/24
- IPC: H01J27/24

Abstract:
A system for producing a charged particle beam from a photoionized cold atom beam. A vapor of neutral atoms is generated. From these atoms, an atom beam having axial and transverse velocity distributions controlled by the application of laser light is produced. The produced atom beam is spatially compressed along each transverse axis, thus reducing the cross-sectional area of the produced beam and reducing a velocity spread of the produced beam along directions transverse to the beam's direction of propagation. Laser light is directed onto at least a portion of the neutral atoms in the atom beam, thereby producing ions and electrons. An electric field is generated at the location of the produced ions and electrons, thereby producing a beam of ions traveling in a first direction and electrons traveling in substantially the opposite direction. A vacuum chamber contains the atom beam, the ion beam and the electron beam.
Public/Granted literature
- US20120145919A1 CHARGED PARTICLE SOURCE FROM A PHOTOIONIZED COLD ATOM BEAM Public/Granted day:2012-06-14
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