Invention Grant
- Patent Title: Semiconductor device and manufacturing method of the same
- Patent Title (中): 半导体器件及其制造方法相同
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Application No.: US13471183Application Date: 2012-05-14
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Publication No.: US08531003B2Publication Date: 2013-09-10
- Inventor: Chang Eun Lee
- Applicant: Chang Eun Lee
- Applicant Address: KR Seoul
- Assignee: Dongbu Hitek Co., Ltd.
- Current Assignee: Dongbu Hitek Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Murabito, Hao & Barnes LLP
- Agent Andrew D. Fortney
- Priority: KR10-2011-0104935 20111014
- Main IPC: H01L29/00
- IPC: H01L29/00

Abstract:
Provided is a semiconductor device. The semiconductor device includes a first insulation layer on a semiconductor substrate, the first insulation layer including a lower metal line, a metal head pattern on the first insulation layer, the metal head pattern including an inclined side surface, a thin film resistor pattern on the metal head pattern, a second insulation layer on the metal head pattern and the thin film resistor pattern, an upper metal line on the second insulation layer, a first via connecting the lower metal line to the upper metal line, and a second via connecting the metal head pattern to the upper metal line.
Public/Granted literature
- US20130093055A1 Semiconductor Device and Manufacturing Method of the Same Public/Granted day:2013-04-18
Information query
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