发明授权
- 专利标题: Measurement device and measurement method
- 专利标题(中): 测量装置及测量方法
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申请号: US13002920申请日: 2009-07-07
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公开(公告)号: US08532740B2公开(公告)日: 2013-09-10
- 发明人: Kazuhiro Ichikawa , Hideo Utsumi
- 申请人: Kazuhiro Ichikawa , Hideo Utsumi
- 申请人地址: JP Fukuoka
- 专利权人: Kyushi University
- 当前专利权人: Kyushi University
- 当前专利权人地址: JP Fukuoka
- 代理机构: Foley & Lardner LLP
- 优先权: JP2008-178217 20080708
- 国际申请: PCT/IB2009/006533 WO 20090707
- 国际公布: WO2010/004427 WO 20100114
- 主分类号: A61B5/05
- IPC分类号: A61B5/05
摘要:
A measurement device and measurement method make it possible to eliminate the load generated by stopping on a measurement subject that is moved among multiple magnetic field generating devices. The measurement device includes a first external magnetic field generating device that generates a magnetic field of a set size, a second external magnetic field generating device that generates a magnetic field of a size that differs from that of the magnetic field of the first external magnetic field generating device, a rotating table that causes the subject of measurement to pass in sequence through the magnetic fields of the first and second external magnetic field generating devices by causing the subject of measurement to move rotationally, and an OMRI measurement processing part and MRI measurement processing part that measures images such as functional images or structural images of the subject of measurement while it is being moved rotationally by the rotating table.
公开/授权文献
- US20110112395A1 MEASUREMENT DEVICE AND MEASUREMENT METHOD 公开/授权日:2011-05-12
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