Invention Grant
US08543352B2 System for measuring a shape, method for measuring a shape, and computer program product
有权
用于测量形状的系统,测量形状的方法和计算机程序产品
- Patent Title: System for measuring a shape, method for measuring a shape, and computer program product
- Patent Title (中): 用于测量形状的系统,测量形状的方法和计算机程序产品
-
Application No.: US12600527Application Date: 2008-04-02
-
Publication No.: US08543352B2Publication Date: 2013-09-24
- Inventor: Yuki Aritsuka , Morihisa Hoga
- Applicant: Yuki Aritsuka , Morihisa Hoga
- Applicant Address: JP Shinjuku-Ku
- Assignee: Dai Nippon Printing Co., Ltd.
- Current Assignee: Dai Nippon Printing Co., Ltd.
- Current Assignee Address: JP Shinjuku-Ku
- Agency: Burr & Brown
- Priority: JP2007-135633 20070522
- International Application: PCT/JP2008/056564 WO 20080402
- International Announcement: WO2008/142916 WO 20081127
- Main IPC: G01B3/46
- IPC: G01B3/46 ; G01B3/04 ; G01B3/20 ; H04B17/00

Abstract:
A system for measuring a shape, includes an external storage unit storing tolerances of first and second shape factors defining a design shape of a measuring object; a first measuring tool measuring the first shape factor of the measuring object to obtain measurement data; and a measurement processing unit determining a shape of the measuring object. The measurement processing unit includes; a comparison module comparing the measurement data of the first shape factor with the tolerance of the first shape factor; a verification module composing a predicted shape using the measurement data and verifying whether the predicted shape is formed as a figure; a calculation module calculating predicted data of the second shape factor from the predicted shape; and a determination module determining a measurement shape by comparing the predicted data with the tolerance of the second shape factor.
Public/Granted literature
- US20100169042A1 SYSTEM FOR MEASURING A SHAPE, METHOD FOR MEASURING A SHAPE, AND COMPUTER PROGRAM PRODUCT Public/Granted day:2010-07-01
Information query