发明授权
US08546235B2 Integrated circuits including metal-insulator-metal capacitors and methods of forming the same
有权
包括金属 - 绝缘体 - 金属电容器的集成电路及其形成方法
- 专利标题: Integrated circuits including metal-insulator-metal capacitors and methods of forming the same
- 专利标题(中): 包括金属 - 绝缘体 - 金属电容器的集成电路及其形成方法
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申请号: US13101788申请日: 2011-05-05
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公开(公告)号: US08546235B2公开(公告)日: 2013-10-01
- 发明人: Sung-Hui Huang , Yuan-Hung Liu , Ming-Fa Chen
- 申请人: Sung-Hui Huang , Yuan-Hung Liu , Ming-Fa Chen
- 申请人地址: TW
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW
- 代理机构: Lowe Hauptman & Ham, LLP
- 主分类号: H01L21/20
- IPC分类号: H01L21/20
摘要:
An integrated circuit includes a substrate and a first metal-insulator-metal (MIM) capacitor disposed over the substrate. The MIM capacitor includes a first metallic capacitor plate disposed over the substrate. At least one first insulator layer is disposed over the first metallic capacitor plate. A second metallic capacitor plate is disposed over the at least one first insulator layer. At least one first dielectric layer is disposed over the substrate. At least a portion of the at least one first dielectric layer is disposed between the first metallic capacitor plate and the at least one first insulator layer.
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