发明授权
- 专利标题: Test apparatus and test module
- 专利标题(中): 测试仪器和测试模块
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申请号: US12694149申请日: 2010-01-26
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公开(公告)号: US08547125B2公开(公告)日: 2013-10-01
- 发明人: Tadashi Morita , Tetsuya Koishi , Takeshi Yaguchi
- 申请人: Tadashi Morita , Tetsuya Koishi , Takeshi Yaguchi
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 主分类号: G01R31/3187
- IPC分类号: G01R31/3187
摘要:
Provided is a test apparatus for testing at least one device under test, including: a test module that includes a plurality of test sections, the plurality of test sections testing the device under test by exchanging signals with the device under test; and a plurality of test control sections that control the plurality of test sections, where the test module includes the plurality of test sections; a setting storage section that stores setting as to which of the plurality of test control sections should be associated with each of the plurality of test sections; and an interface section that is connected to the plurality of test sections, provides an access request issued from one of the plurality of test control sections and directed to the test module, to a test section associated with the test control section, and is able to set, independently for each of the plurality of test sections, which of the plurality of test control sections should control the test section.
公开/授权文献
- US20110181309A1 TEST APPARATUS AND TEST MODULE 公开/授权日:2011-07-28