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US08547764B2 Semiconductor memory device and method for performing data compression test of the same 失效
半导体存储器件及其执行数据压缩测试的方法

Semiconductor memory device and method for performing data compression test of the same
Abstract:
A semiconductor memory device includes a plurality of data transmission lines, a plurality of parallel-to-serial conversion sections configured to receive, serially align, and output data from at least two of the plurality of data transmission lines, a plurality of data compression circuits configured to receive, compress, and output outputs of at least two of the plurality of parallel-to-serial conversion sections, and a plurality of data output circuits configured to output respective compression results of the plurality of data compression circuits to an outside of a chip.
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