Invention Grant
- Patent Title: Semiconductor memory device and method for performing data compression test of the same
- Patent Title (中): 半导体存储器件及其执行数据压缩测试的方法
-
Application No.: US12647196Application Date: 2009-12-24
-
Publication No.: US08547764B2Publication Date: 2013-10-01
- Inventor: Jae-Woong Yun , Jong-Chern Lee , Hee-Jin Byun
- Applicant: Jae-Woong Yun , Jong-Chern Lee , Hee-Jin Byun
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2009-0104687 20091030
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A semiconductor memory device includes a plurality of data transmission lines, a plurality of parallel-to-serial conversion sections configured to receive, serially align, and output data from at least two of the plurality of data transmission lines, a plurality of data compression circuits configured to receive, compress, and output outputs of at least two of the plurality of parallel-to-serial conversion sections, and a plurality of data output circuits configured to output respective compression results of the plurality of data compression circuits to an outside of a chip.
Public/Granted literature
- US20110103164A1 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR PERFORMING DATA COMPRESSION TEST OF THE SAME Public/Granted day:2011-05-05
Information query