Invention Grant
- Patent Title: Scratch resistance test methods and apparatus
- Patent Title (中): 耐刮擦试验方法和装置
-
Application No.: US12913240Application Date: 2010-10-27
-
Publication No.: US08549891B2Publication Date: 2013-10-08
- Inventor: James Ryan , Alexander Hutter
- Applicant: James Ryan , Alexander Hutter
- Applicant Address: JP Tokyo
- Assignee: Honda Motor Co., Ltd.
- Current Assignee: Honda Motor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Capitol City TechLaw, PLLC
- Agent Mark E. Duell
- Main IPC: G01N3/56
- IPC: G01N3/56

Abstract:
The apparatus and methods disclosed may be utilized for the scratch/mar testing of various materials and components that provide improved correlation between the simulated damage modes and those reasonably expected to be encountered by the final components. The apparatus includes both a fixture configured for receiving and holding the material under test (MUT) and a tool holder that is arranged and configured for supporting and holding a variety of test tools in one or more orientations relative to the MUT. The tool holder and/or the fixture are, in turn, supported by one or more assemblies arranged and configured for bringing the tool into contact with the MUT and providing for movement of the tool relative to the MUT. The apparatus is then used for collecting data from a series of tests that can be used to compare the performance of different MUT compositions and configurations.
Public/Granted literature
- US20120103055A1 Scratch Resistance Test Methods and Apparatus Public/Granted day:2012-05-03
Information query