发明授权
- 专利标题: Enhanced stacked microelectronic assemblies with central contacts and improved thermal characteristics
- 专利标题(中): 具有中心触点和改善的热特性的增强堆叠微电子组件
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申请号: US12907522申请日: 2010-10-19
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公开(公告)号: US08553420B2公开(公告)日: 2013-10-08
- 发明人: Belgacem Haba , Wael Zohni , Richard Dewitt Crisp
- 申请人: Belgacem Haba , Wael Zohni , Richard Dewitt Crisp
- 申请人地址: US CA San Jose
- 专利权人: Tessera, Inc.
- 当前专利权人: Tessera, Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- 主分类号: H05K7/00
- IPC分类号: H05K7/00 ; H05K1/11 ; H05K1/14
摘要:
A microelectronic assembly includes a dielectric element having oppositely-facing first and second surfaces and one or more apertures extending between the surfaces, the dielectric element further having conductive elements thereon; a first microelectronic element having a rear surface and a front surface facing the first surface of the dielectric element, the first microelectronic element having a first edge and a plurality of contacts exposed at the front surface thereof; a second microelectronic element including having a rear surface and a front surface facing the rear surface of the first microelectronic element, a projecting portion of the front surface of the second microelectronic element extending beyond the first edge of the first microelectronic element, the projecting portion being spaced from the first surface of the dielectric element, the second microelectronic element having a plurality of contacts exposed at the projecting portion of the front surface; leads extending from contacts of the microelectronic elements through the at least one aperture to at least some of the conductive elements; and a heat spreader thermally coupled to at least one of the first microelectronic element or the second microelectronic element.
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