发明授权
- 专利标题: Image processing method and image inspecting method
- 专利标题(中): 图像处理方法和图像检查方法
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申请号: US12529868申请日: 2007-03-06
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公开(公告)号: US08553928B2公开(公告)日: 2013-10-08
- 发明人: Hitoshi Kiya , Kiyoshi Nishikawa , Masaaki Fujiyoshi , Yoichi Hata , Toshiaki Kakii , Yoshimitsu Goto
- 申请人: Hitoshi Kiya , Kiyoshi Nishikawa , Masaaki Fujiyoshi , Yoichi Hata , Toshiaki Kakii , Yoshimitsu Goto
- 申请人地址: JP Osaka JP Tokyo
- 专利权人: Sumitomo Electric Industries, Ltd.,Tokyo Metropolitan University
- 当前专利权人: Sumitomo Electric Industries, Ltd.,Tokyo Metropolitan University
- 当前专利权人地址: JP Osaka JP Tokyo
- 代理机构: McDermott Will & Emery LLP
- 国际申请: PCT/JP2007/054317 WO 20070306
- 国际公布: WO2008/107973 WO 20080912
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
The present invention relates to an image processing method and image inspecting method with high versatility which enable efficient and highly accurate proof of authenticity of a digital image. The image processing method subjects at least a part of a digital image which can exist temporarily or continuously in a falsification-vulnerable environment, to a first morphology operation using a predetermined structuring element, to process the digital image. The image inspecting method subjects the digital image thus processed, to a second morphology operation using the same structuring element as in the first morphology operation. The morphology operations have the idempotent and the presence or absence of falsification can be detected by determining identity of images before and after the second morphology operation.
公开/授权文献
- US20100128923A1 IMAGE PROCESSING METHOD AND IMAGE INSPECTING METHOD 公开/授权日:2010-05-27
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