Invention Grant
- Patent Title: Systems and methods for weigh scale perimeter monitoring scanner-scales
- Patent Title (中): 称重秤周边监控扫描仪的系统和方法
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Application No.: US12956716Application Date: 2010-11-30
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Publication No.: US08556175B2Publication Date: 2013-10-15
- Inventor: Alexander M. McQueen , Patrick M. O'Donnell
- Applicant: Alexander M. McQueen , Patrick M. O'Donnell
- Applicant Address: US OR Eugene
- Assignee: Datalogic ADC, Inc.
- Current Assignee: Datalogic ADC, Inc.
- Current Assignee Address: US OR Eugene
- Agency: Stoel Rives LLP
- Main IPC: G06K7/10
- IPC: G06K7/10

Abstract:
Systems and methods for reducing erroneous weighing of items such as by detecting items extending beyond a periphery of a weigh platter whereby in one configuration, the system employs a light guide for routing a light beam to a detector operative to detect interruption of the beam due to an item encroaching upon or overhanging an edge of the platter. In another configuration, the scale includes a perimeter gap between the platter outer edge and scanner housing frame or checkout counter, a light beam directed angularly upward through the gap is partially obstructed by the frame and platter whereby light exits the gap forming a light plane, wherein an object placed on the platter extending across the gap intersects the light plane thus scattering light rays, some of which are sensed by a detector. Various indicators for alerting the operator of off-scale detection are also described.
Public/Granted literature
- US20110132985A1 SYSTEMS AND METHODS FOR WEIGH SCALE PERIMETER MONITORING FOR SCANNER-SCALES Public/Granted day:2011-06-09
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