发明授权
- 专利标题: Semiconductor memory device
- 专利标题(中): 半导体存储器件
-
申请号: US13343972申请日: 2012-01-05
-
公开(公告)号: US08559234B2公开(公告)日: 2013-10-15
- 发明人: Noriyasu Kumazaki , Susumu Fujimura
- 申请人: Noriyasu Kumazaki , Susumu Fujimura
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2011-000661 20110105
- 主分类号: G11C16/06
- IPC分类号: G11C16/06
摘要:
According to one embodiment, a semiconductor memory device includes a memory cell array, a first detecting circuit, a second detecting circuit, a switching circuit and a recovery control circuit. The first detecting circuit outputs a first detection signal which shows whether an externally supplied external power supply is equal to or more than a first voltage. The second detecting circuit outputs, at a higher speed than the first detecting circuit, a second detection signal which shows whether the external power supply is equal to or more than the first voltage. In a write operation, the switching circuit outputs the second detection signal output from the second detecting circuit. In an operation other than the write operation, the switching circuit outputs the first detection signal output from the first detecting circuit. The recovery control circuit terminates the write operation according to the second detection signal output from the switching circuit.
公开/授权文献
- US20120170380A1 SEMICONDUCTOR MEMORY DEVICE 公开/授权日:2012-07-05
信息查询