- 专利标题: XRF system having multiple excitation energy bands in highly aligned package
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申请号: US12920641申请日: 2009-03-03
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公开(公告)号: US08559597B2公开(公告)日: 2013-10-15
- 发明人: Zewu Chen , David M. Gibson , Walter M. Gibson , Adam Bailey , R. Scott Semken , Kai Xin , John H. Burdett
- 申请人: Zewu Chen , David M. Gibson , Walter M. Gibson , Adam Bailey , R. Scott Semken , Kai Xin , John H. Burdett
- 申请人地址: US NY East Greenbush
- 专利权人: X-Ray Optical Systems, Inc.
- 当前专利权人: X-Ray Optical Systems, Inc.
- 当前专利权人地址: US NY East Greenbush
- 代理机构: Heslin Rothenberg Farley & Mesiti P.C.
- 代理商 Jeff Klembczyk; Kevin P. Radigan, Esq.
- 国际申请: PCT/US2009/035847 WO 20090303
- 国际公布: WO2009/111454 WO 20090911
- 主分类号: G21K1/06
- IPC分类号: G21K1/06
摘要:
An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
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