Invention Grant
- Patent Title: Measurement apparatus and method thereof
- Patent Title (中): 测量装置及其方法
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Application No.: US12609141Application Date: 2009-10-30
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Publication No.: US08561806B2Publication Date: 2013-10-22
- Inventor: Dong-Sheng Lin , Tzyy-Chyi Tsai , Jian-Jun Li
- Applicant: Dong-Sheng Lin , Tzyy-Chyi Tsai , Jian-Jun Li
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Altis & Wispro Law Group, Inc.
- Priority: CN200910301385 20090408
- Main IPC: B07C5/00
- IPC: B07C5/00

Abstract:
A measurement apparatus includes a support frame to support a feed mechanism, an orientation mechanism, a measurement mechanism, a transfer mechanism, and an unloading mechanism. The feed mechanism includes a first holding assembly, a first elevation assembly, a second elevation assembly, and a first clipping assembly. The first elevation assembly and the second elevation assembly are positioned under the holding assembly, and the first clipping assembly is positioned over the holding assembly. The measurement mechanism includes a support stage and at least one calibration head. The transfer mechanism includes at least one pickup head. The orientation mechanism includes a driving member and a securing assembly driven by the driving member. The unloading mechanism has the same structure as the feed mechanism. The disclosure further provides a measuring method using the measurement apparatus.
Public/Granted literature
- US20100260583A1 MEASUREMENT APPARATUS AND METHOD THEREOF Public/Granted day:2010-10-14
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