Mechanisms for improving static noise margin and/or reducing misread current in multi-port devices are disclosed. In some embodiments related to dual port SRAM a suppress device (e.g., transistor) is provided at each word line port. When both ports are activated, both suppress devices are on and lower the voltage level of these ports, which in turn lower the voltage level at the node storing the data for the memory. As the voltage level at the data node is lowered, noise margin is improved and read disturb can be avoided.