发明授权
US08565865B2 Methods for the determination of T-shock vulnerable window from far-field electrograms in implantable cardioverter defibrillators
有权
用于在植入式心律转复除颤器中远场电描记图测定T型休克脆弱窗的方法
- 专利标题: Methods for the determination of T-shock vulnerable window from far-field electrograms in implantable cardioverter defibrillators
- 专利标题(中): 用于在植入式心律转复除颤器中远场电描记图测定T型休克脆弱窗的方法
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申请号: US12178850申请日: 2008-07-24
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公开(公告)号: US08565865B2公开(公告)日: 2013-10-22
- 发明人: Paul A. Belk , Jian Cao , Jeffrey M. Gillberg , Charles D. Swerdlow
- 申请人: Paul A. Belk , Jian Cao , Jeffrey M. Gillberg , Charles D. Swerdlow
- 申请人地址: US MN Minneapolis US CA Los Angeles
- 专利权人: Medtronic, Inc.,Imperception, Inc.
- 当前专利权人: Medtronic, Inc.,Imperception, Inc.
- 当前专利权人地址: US MN Minneapolis US CA Los Angeles
- 代理机构: Shumaker & Sieffert, P.A.
- 主分类号: A61N1/39
- IPC分类号: A61N1/39
摘要:
Methods for determination of timing for electrical shocks to the heart to determine shock strength necessary to defibrillate a fibrillating heart. The timing corresponds the window of most vulnerability in the heart, which occurs during the T-wave of a heartbeat. Using a derivatized T-wave representation, the timing of most vulnerability is determined by a center of the area method, peak amplitude method, width method, or other similar methods. Devices are similarly disclosed embodying the methods of the present disclosure.
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