发明授权
- 专利标题: Probe shape detection apparatus and probe shape detection method
- 专利标题(中): 探头形状检测装置和探头形状检测方法
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申请号: US13596524申请日: 2012-08-28
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公开(公告)号: US08566052B2公开(公告)日: 2013-10-22
- 发明人: Hiroyuki Ushifusa
- 申请人: Hiroyuki Ushifusa
- 申请人地址: JP Tokyo
- 专利权人: Olympus Medical Systems Corp.
- 当前专利权人: Olympus Medical Systems Corp.
- 当前专利权人地址: JP Tokyo
- 代理机构: Scully, Scott, Murphy & Presser, P.C.
- 优先权: JP2010-132211 20100609
- 主分类号: G01R25/00
- IPC分类号: G01R25/00 ; G01R27/00 ; G01C9/00 ; G01C17/00 ; G01C19/00 ; A61B5/05
摘要:
A probe shape detection apparatus includes first and second magnetic field detection sections that outputs a signal in accordance with an electromotive voltage group generated when the magnetic field emitted from a magnetic field generation element provided in a longitudinal direction of a probe is detected, a candidate vector calculation section that calculates a candidate vector based on the electromotive voltage group generated in the first magnetic field detection section and one piece of candidate position information, an estimated electromotive voltage calculation section that calculates an estimated electromotive voltage based on the one piece of candidate position information and the candidate vector and an estimated position acquiring section that acquires a candidate position that minimizes an error between the electromotive voltage group generated in the second magnetic field detection section and the estimated electromotive voltage as an estimated position of the magnetic field generation element.
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