Invention Grant
US08569086B2 Semiconductor device and method of dicing semiconductor devices 有权
半导体器件切割半导体器件及方法

Semiconductor device and method of dicing semiconductor devices
Abstract:
A method and apparatus for separating a substrate into individual dies and the resulting structure is provided. A modification layer, such as an amorphous layer, is formed within the substrate. A laser focused within the substrate may be used to create the modification layer. The modification layer creates a relatively weaker region that is more prone to cracking than the surrounding substrate material. As a result, the substrate may be pulled apart into separate sections, causing cracks the substrate along the modification layers. Dice or other components may be attached to the substrate before or after separation.
Public/Granted literature
Information query
Patent Agency Ranking
0/0