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US08569837B2 MOS devices having elevated source/drain regions 有权
具有升高的源极/漏极区域的MOS器件

MOS devices having elevated source/drain regions
Abstract:
A semiconductor structure includes a semiconductor substrate; a gate dielectric over the semiconductor substrate; a gate electrode over the gate dielectric; a deep source/drain region adjacent the gate electrode; a silicide region over the deep source/drain region; and an elevated metallized source/drain region between the silicide region and the gate electrode. The elevated metallized source/drain region adjoins the silicide region.
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