发明授权
- 专利标题： Optoelectronic methods and devices for detection of analytes
- 专利标题（中）： 用于检测分析物的光电方法和装置
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申请号： US12728883申请日： 2010-03-22
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公开(公告)号： US08576400B2公开(公告)日： 2013-11-05
- 发明人: John C. Hulteen , Kiran S. Kanukurthy , Neal A. Rakow , Andrzej F. Rybacha , Richard L. Rylander , Arthur Scheffler , Zeljko Zupanc
- 申请人： John C. Hulteen , Kiran S. Kanukurthy , Neal A. Rakow , Andrzej F. Rybacha , Richard L. Rylander , Arthur Scheffler , Zeljko Zupanc
- 申请人地址： US MN St. Paul
- 专利权人： 3M Innovative Properties Company
- 当前专利权人： 3M Innovative Properties Company
- 当前专利权人地址： US MN St. Paul
- 代理商 Kenneth B. Wood
- 主分类号： G01N21/55
- IPC分类号： G01N21/55
摘要：
Herein are disclosed optoelectronic methods and devices for detecting the presence of an analyte. Such methods and devices may comprise at least one sensing element that is responsive to the presence of an analyte of interest and that may be interrogated optically by the use of at least one light source and at least one light detector.
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